Spectroscopic characterization of highly doped ZnO films grown by atomic-layer deposition for three-dimensional infrared metamaterials [Invited]

标题
Spectroscopic characterization of highly doped ZnO films grown by atomic-layer deposition for three-dimensional infrared metamaterials [Invited]
作者
关键词
-
出版物
Optical Materials Express
Volume 1, Issue 5, Pages 883
出版商
The Optical Society
发表日期
2011-09-02
DOI
10.1364/ome.1.000883

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