Atomic layer deposition TiO 2 coated porous silicon surface: Structural characterization and morphological features

标题
Atomic layer deposition TiO 2 coated porous silicon surface: Structural characterization and morphological features
作者
关键词
Atomic layer deposition, Titanium dioxide, Porous silicon
出版物
THIN SOLID FILMS
Volume 589, Issue -, Pages 303-308
出版商
Elsevier BV
发表日期
2015-05-29
DOI
10.1016/j.tsf.2015.05.056

向作者/读者发起求助以获取更多资源

Reprint

联系作者

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started