Etching-free patterning method for electrical characterization of atomically thin MoSe2films grown by chemical vapor deposition
出版年份 2014 全文链接
标题
Etching-free patterning method for electrical characterization of atomically thin MoSe2films grown by chemical vapor deposition
作者
关键词
-
出版物
Nanoscale
Volume 6, Issue 21, Pages 12376-12382
出版商
Royal Society of Chemistry (RSC)
发表日期
2014-08-11
DOI
10.1039/c4nr03817g
参考文献
相关参考文献
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