Investigation of micropipe and defects in molten KOH etching of 6H n-silicon carbide (SiC) single crystal

标题
Investigation of micropipe and defects in molten KOH etching of 6H n-silicon carbide (SiC) single crystal
作者
关键词
-
出版物
MATERIALS LETTERS
Volume 101, Issue -, Pages 72-75
出版商
Elsevier BV
发表日期
2013-03-24
DOI
10.1016/j.matlet.2013.03.079

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation