Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy

出版年份 2013 全文链接

标题

作者

关键词

Scan Tunnel Microscopy, External Electric Field, Attractive Force, Scan Tunnel Microscopy Image, High Resistance State

出版物

TECHNICAL PHYSICS

Volume 58, Issue 12, Pages 1831-1836

出版商

Pleiades Publishing Ltd

发表日期

2013-12-10

DOI

10.1134/s1063784213120025

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