Thermal stress driven Sn whisker growth: in air and in vacuum

标题
Thermal stress driven Sn whisker growth: in air and in vacuum
作者
关键词
Thermal Cycle, Whisker Growth, Thermal Cycling Test, Root Crack, Whisker Density
出版物
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume 24, Issue 10, Pages 3897-3904
出版商
Springer Nature
发表日期
2013-06-15
DOI
10.1007/s10854-013-1336-6

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