Reduction of defect formation in amorphous indium-gallium-zinc-oxide thin film transistors by N2O plasma treatment

Optical modeling and experimental verification of light induced phenomena in In-Ga-Zn-O thin film transistors with varying gate insulator thickness

(2012) Yoon Jang Chung et al.   JOURNAL OF APPLIED PHYSICS

Redox Reaction Switching Mechanism in RRAM Device With $\hbox{Pt/CoSiO}_{X}\hbox{/}\hbox{TiN}$ Structure

(2011) Yong-En Syu et al.   IEEE ELECTRON DEVICE LETTERS

Characterizations of Amorphous IGZO Thin-Film Transistors With Low Subthreshold Swing

(2011) Liang-Yu Su et al.   IEEE ELECTRON DEVICE LETTERS

Developments in nanocrystal memory

(2011) Ting-Chang Chang et al.   Materials Today

Surface states related the bias stability of amorphous In–Ga–Zn–O thin film transistors under different ambient gasses

(2011) Yu-Chun Chen et al.   THIN SOLID FILMS

Investigation of the gate-bias induced instability for InGaZnO TFTs under dark and light illumination

(2011) T.C. Chen et al.   THIN SOLID FILMS

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress

(2010) Yu-Chun Chen et al.   APPLIED PHYSICS LETTERS

Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition

(2010) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

(2010) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films

(2010) Min-Chen Chen et al.   APPLIED PHYSICS LETTERS

Bipolar Resistive Switching Characteristics of Transparent Indium Gallium Zinc Oxide Resistive Random Access Memory

(2010) Min-Chen Chen et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Influence of Nanocrystals on Resistive Switching Characteristic in Binary Metal Oxides Memory Devices

(2010) Yu-Ting Tsai et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

A low-temperature method for improving the performance of sputter-deposited ZnO thin-film transistors with supercritical fluid

(2009) Min-Chen Chen et al.   APPLIED PHYSICS LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress

(2009) Po-Tsun Liu et al.   APPLIED PHYSICS LETTERS

High mobility InGaZnO4 thin-film transistors on paper

(2009) Wantae Lim et al.   APPLIED PHYSICS LETTERS

Origins of High Mobility and Low Operation Voltage of Amorphous Oxide TFTs: Electronic Structure, Electron Transport, Defects and Doping*

(2009) Toshio Kamiya et al.   Journal of Display Technology

Inkjet-Printed High Mobility Transparent–Oxide Semiconductors

(2009) Seung-Yeol Han et al.   Journal of Display Technology

Reliability characteristics of NiSi nanocrystals embedded in oxide and nitride layers for nonvolatile memory application

(2008) Wei-Ren Chen et al.   APPLIED PHYSICS LETTERS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

High field-effect mobility amorphous InGaZnO transistors with aluminum electrodes

(2008) Jong H. Na et al.   APPLIED PHYSICS LETTERS

Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water

(2008) Jin-Seong Park et al.   APPLIED PHYSICS LETTERS

Transparent, high mobility InGaZnO thin films deposited by PLD

(2007) Arun Suresh et al.   THIN SOLID FILMS