Abnormal threshold voltage shift under hot carrier stress in Ti1−xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors

Investigation of an anomalous hump in gate current after negative-bias temperature-instability in HfO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors

(2013) Szu-Han Ho et al.   APPLIED PHYSICS LETTERS

Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation

(2012) Wen-hung Lo et al.   IEEE ELECTRON DEVICE LETTERS

Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

(2011) Chih-Hao Dai et al.   APPLIED PHYSICS LETTERS

Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

(2011) Chih-Hao Dai et al.   APPLIED PHYSICS LETTERS

Redox Reaction Switching Mechanism in RRAM Device With $\hbox{Pt/CoSiO}_{X}\hbox{/}\hbox{TiN}$ Structure

(2011) Yong-En Syu et al.   IEEE ELECTRON DEVICE LETTERS

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

(2011) Chih-Hao Dai et al.   IEEE ELECTRON DEVICE LETTERS

Developments in nanocrystal memory

(2011) Ting-Chang Chang et al.   Materials Today

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

(2010) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

(2010) Chih-Tsung Tsai et al.   APPLIED PHYSICS LETTERS

Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films

(2010) Min-Chen Chen et al.   APPLIED PHYSICS LETTERS

On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs

(2010) Chih-Hao Dai et al.   IEEE ELECTRON DEVICE LETTERS

Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strain

(2010) Chih-Hao Dai et al.   SURFACE & COATINGS TECHNOLOGY

Channel Hot-Carrier Degradation in Short-Channel Transistors With High- $k$/Metal Gate Stacks

(2009) E. Amat et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY