New perspectives in the surface analysis of energy materials by combined time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high sensitivity low-energy ion scattering (HS-LEIS)
出版年份 2014 全文链接
标题
New perspectives in the surface analysis of energy materials by combined time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high sensitivity low-energy ion scattering (HS-LEIS)
作者
关键词
-
出版物
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
Volume 29, Issue 8, Pages 1361
出版商
Royal Society of Chemistry (RSC)
发表日期
2014-04-04
DOI
10.1039/c3ja50292a
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