4.6 Article

Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

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APPLIED PHYSICS LETTERS
卷 101, 期 15, 页码 -

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AMER INST PHYSICS
DOI: 10.1063/1.4758699

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  1. Marie Curie Intra European Fellowship within the 7th European Community Framework Programme the European Union (IonBeatHeteroMat) [PIEF-GA-2010-274999]
  2. Engineering and Physical Sciences Research Council [EP/H006060/1] Funding Source: researchfish
  3. EPSRC [EP/H006060/1] Funding Source: UKRI

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Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He+ scattered by O-18-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E-i<0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E-i>2 keV. The ion fractions P+ were determined for Si and O using the characteristic velocity method to quantify the surface density. The O-18/O-16 sensitivity ratio indicates an 18% higher sensitivity for the heavier O isotope. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4758699]

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