Optical characterization of hafnium oxide thin films for heat mirrors

标题

作者

关键词

Optical properties, Annealing, X-ray diffraction, Atomic force microscopy, Insulator-metal-insulator (IMI) structure

出版物

Volume 32, Issue -, Pages 22-30

出版商

Elsevier BV

发表日期

2015-01-22

DOI

10.1016/j.mssp.2014.12.079

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