Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble

出版年份 2007 全文链接

标题

Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble

作者

关键词

-

出版物

EXPERT SYSTEMS WITH APPLICATIONS

Volume 36, Issue 2, Pages 1978-1998

出版商

Elsevier BV

发表日期

2007-12-28

DOI

10.1016/j.eswa.2007.12.015

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Protocol

Reagent

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