Testing of flexible InGaZnO-based thin-film transistors under mechanical strain

标题
Testing of flexible InGaZnO-based thin-film transistors under mechanical strain
作者
关键词
-
出版物
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
Volume 55, Issue 2, Pages 23904
出版商
EDP Sciences
发表日期
2011-08-11
DOI
10.1051/epjap/2011100416

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