Effects of Interfacial Dielectric Layers on the Electrical Performance of Top-Gate In-Ga-Zn-Oxide Thin-Film Transistors

Impact of high-k TiOx dielectric on device performance of indium-gallium-zinc oxide transistors

(2009) Jin-Seong Park et al.   APPLIED PHYSICS LETTERS

Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

(2009) Jae-Heon Shin et al.   ETRI JOURNAL

Low-Frequency Noise in Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistors

(2009) Jeong-Min Lee et al.   IEEE ELECTRON DEVICE LETTERS

Optimization of an Amorphous In-Ga-Zn-Oxide Semiconductor for a Top-Gate Transparent Thin-Film Transistor

(2009) Woo-Seok Cheong et al.   JOURNAL OF THE KOREAN PHYSICAL SOCIETY

Interface dependent electrical properties of amorphous InGaZnO[sub 4] thin film transistors

(2009) Wantae Lim et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

Process development of ITO source/drain electrode for the top-gate indium–gallium–zinc oxide transparent thin-film transistor

(2009) Woo-Seok Cheong et al.   THIN SOLID FILMS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS