4.6 Article

Self-purification model for metal-assisted chemical etching of metallurgical silicon

期刊

ELECTROCHIMICA ACTA
卷 138, 期 -, 页码 476-480

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.electacta.2014.05.048

关键词

Metal assisted chemical etching; metallurgical silicon; purification effect; transitional metal impurity; etching model

资金

  1. National Research Foundation of Korea (NRF) - Korean government (MEST) [2011-0028604]
  2. Thousand Talents Program
  3. Priority Academic Program Development of Jiangsu Higher Education Institutions (PAPD)

向作者/读者索取更多资源

Metal-assisted chemical etching (MaCE) of metallurgical-grade silicon (MG-Si) has improved the purity of MG-Si (similar to 99%) to close to solar-grade (similar to 99.9999%) by removing metal impurities during the successful preparation of porous silicon nanowires (SiNWs). A new etching principle is proposed to explain the different levels of chemical reduction between various metal impurities with pore formation during etching. This model provides chemical insights into the relationship between dissolved metal ions and pores evolved during the formation of SiNWs. (C) 2014 Elsevier Ltd. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据