标题
Aberration-corrected STEM for atomic-resolution imaging and analysis
作者
关键词
-
出版物
JOURNAL OF MICROSCOPY
Volume 259, Issue 3, Pages 165-172
出版商
Wiley
发表日期
2015-05-05
DOI
10.1111/jmi.12254
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- The correction of electron lens aberrations
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