Investigation of material removal mechanism of silicon wafer in the chemical mechanical polishing process using molecular dynamics simulation method

标题
Investigation of material removal mechanism of silicon wafer in the chemical mechanical polishing process using molecular dynamics simulation method
作者
关键词
-
出版物
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 95, Issue 3, Pages 899-905
出版商
Springer Nature
发表日期
2009-01-29
DOI
10.1007/s00339-009-5097-2

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