A FinFET SRAM cell design with BTI robustness at high supply voltages and high yield at low supply voltages
出版年份 2015 全文链接
标题
A FinFET SRAM cell design with BTI robustness at high supply voltages and high yield at low supply voltages
作者
关键词
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出版物
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS
Volume 43, Issue 12, Pages 2011-2024
出版商
Wiley
发表日期
2015-01-13
DOI
10.1002/cta.2057
参考文献
相关参考文献
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