Gate-Bias Controlled Charge Trapping as a Mechanism for NO2 Detection with Field-Effect Transistors

标题
Gate-Bias Controlled Charge Trapping as a Mechanism for NO2 Detection with Field-Effect Transistors
作者
关键词
-
出版物
ADVANCED FUNCTIONAL MATERIALS
Volume 21, Issue 1, Pages 100-107
出版商
Wiley
发表日期
2010-11-15
DOI
10.1002/adfm.201001560

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