4.4 Article

High quality ultrafast transmission electron microscopy using resonant microwave cavities

期刊

ULTRAMICROSCOPY
卷 188, 期 -, 页码 85-89

出版社

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2018.03.012

关键词

Ultrafast transmission electron microscopy; Pump-probe; Microwave cavities; Coherent ultrashort electron pulses

向作者/读者索取更多资源

Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM110 deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of 814 +/- 2 pA, the root-mean-square transverse normalized emittance of the electron pulses is epsilon(n,x) = (2.7 +/- 0.1) . 10(-12) m rad in the direction parallel to the streak of the cavity, and epsilon(n,y) = (2.5 +/- 0.1) . 10(-12) m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is epsilon(n,x) = epsilon(n,y) = (2.5 +/- 0.1) . 10(-12) m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of 0.95 perpendicular to 0.05 eV has been measured. (c) 2018 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

Article Chemistry, Physical

Communication: Effects of thermionic-gun parameters on operating modes in ultrafast electron microscopy

Erik Kieft, Karl B. Schliep, Pranav K. Suri, David J. Flannigan

STRUCTURAL DYNAMICS-US (2015)

Article Chemistry, Physical

Time-of-flight electron energy loss spectroscopy using TM110 deflection cavities

W. Verhoeven, J. F. M. van Rens, M. A. W. van Ninhuijs, W. F. Toonen, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

STRUCTURAL DYNAMICS-US (2016)

Article Microscopy

Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM110 mode for ultrafast electron microscopy

J. F. M. van Rens, W. Verhoeven, J. G. H. Franssen, A. C. Lassise, X. F. D. Stragier, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

ULTRAMICROSCOPY (2018)

Article Physics, Applied

Refinement of Monte Carlo simulations of electron-specimen interaction in low-voltage SEM

Erik Kieft, Eric Bosch

JOURNAL OF PHYSICS D-APPLIED PHYSICS (2008)

Article Physics, Applied

Dual mode microwave deflection cavities for ultrafast electron microscopy

J. F. M. van Rens, W. Verhoeven, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

APPLIED PHYSICS LETTERS (2018)

Article Microscopy

Complementary cathodoluminescence lifetime imaging configurations in a scanning electron microscope

S. Meuret, M. Sola Garcia, T. Coenen, E. Kieft, H. Zeijlemaker, M. Latzel, S. Christiansen, S. Y. Woo, Y. H. Ra, Z. Mi, A. Polman

ULTRAMICROSCOPY (2019)

Article Chemistry, Physical

Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker

I. G. C. Weppelman, R. J. Moerland, L. Zhang, E. Kieft, P. Kruit, J. P. Hoogenboom

STRUCTURAL DYNAMICS-US (2019)

Article Instruments & Instrumentation

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy

W. Verhoeven, J. F. M. van Rens, A. H. Kemper, E. H. Rietman, H. A. van Doorn, I. Koole, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

REVIEW OF SCIENTIFIC INSTRUMENTS (2019)

Article Chemistry, Physical

Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities

W. Verhoeven, J. F. M. van Rens, W. F. Toonen, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

STRUCTURAL DYNAMICS-US (2018)

Article Engineering, Electrical & Electronic

Optoelectronic properties of expanding thermal plasma deposited textured zinc oxide: Effect of aluminum doping

R Groenen, ER Kieft, JL Linden, MCM Van De Sanden

JOURNAL OF ELECTRONIC MATERIALS (2006)

Article Instruments & Instrumentation

Subnanosecond Thomson scattering setup for space and time resolved measurements with reduced background signal

ER Kieft, CHJM Groothuis, JJAM van der Mullen, V Banine

REVIEW OF SCIENTIFIC INSTRUMENTS (2005)

Article Physics, Applied

Time resolved Thomson scattering measurements on a high pressure mercury lamp

N de Vries, X Zhu, ER Kieft, J van der Mullen

JOURNAL OF PHYSICS D-APPLIED PHYSICS (2005)

Article Physics, Fluids & Plasmas

Comparison of experimental and simulated extreme ultraviolet spectra of xenon and tin discharges

ER Kieft, K Garloff, JJAM van der Mullen, V Banine

PHYSICAL REVIEW E (2005)

Article Physics, Fluids & Plasmas

Characterization of a vacuum-arc discharge in tin vapor using time-resolved plasma imaging and extreme ultraviolet spectrometry

ER Kieft, JJAM van der Mullen, GMW Kroesen, V Banine, KN Koshelev

PHYSICAL REVIEW E (2005)

Article Microscopy

On central focusing for contrast optimization in direct electron ptychography of thick samples

C. Gao, C. Hofer, T. J. Pennycook

Summary: Ptychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, contrast reversals can occur when the projected potential becomes strong. Recent research has shown that these reversals can be counteracted by adapting the focus. This study explains why the best contrast is often found with the probe focused to the middle of the sample and highlights the importance of convergence angle in thin samples to remove contrast reversals.

ULTRAMICROSCOPY (2024)

Article Microscopy

Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography

J. Lindner, U. Ross, T. Meyer, V. Boureau, M. Seibt, Ch. Jooss

Summary: Phase-shifting electron holography is an excellent method with high phase sensitivity to reveal electron wave phase information. An advanced drift correction scheme is proposed in this study, which exploits the interface of the TEM specimen and the vacuum area in the hologram. This method allows for obtaining reliable phase information.

ULTRAMICROSCOPY (2024)

Article Microscopy

Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials

Ali Jaberi, Nicolas Brodusch, Jun Song, Raynald Gauvin

Summary: This study investigates knock-on damage in lithium-ion batteries (LIBs) by computing threshold displacement energies (TDEs) and performing Monte Carlo simulation. The results indicate that Li is most sensitive to knock-on damage at moderate electron energies, and TDE is the principal parameter for assessing Li sensitivity to knock-on damage across similar structures.

ULTRAMICROSCOPY (2024)

Article Microscopy

Improving the temporal resolution of event-based electron detectors using neural network cluster analysis

Alexander Schroeder, Christopher Rathje, Leon van Velzen, Maurits Kelder, Sascha Schaefer

Summary: This study utilizes novel event-based electron detector platforms to extend the temporal resolution of electron microscopy. By training a neural network to predict electron arrival time, the researchers were able to improve the timing accuracy and achieve a promising solution for enhancing electron timing precision in various electron microscopy applications.

ULTRAMICROSCOPY (2024)

Article Microscopy

Mean inner potential of elemental crystals from density-functional theory calculations: Efficient computation and trends

Avi Auslender, Nivedita Pandey, Amit Kohn, Oswaldo Dieguez

Summary: This article describes a faster implementation based on DFT for computing the mean inner potential of crystals, providing quantum-mechanical calculations beyond the independent-atom approximation. The study also reveals the dependence of the mean inner potential on sample boundary conditions, mass density, and magnetic susceptibility, highlighting its correlation with various material properties.

ULTRAMICROSCOPY (2024)

Article Microscopy

Self-supervised noise modeling and sparsity guided electron tomography volumetric image denoising

Zhidong Yang, Dawei Zang, Hongjia Li, Zhao Zhang, Fa Zhang, Renmin Han

Summary: In this work, we propose a self-supervised deep learning model for cryo-ET volumetric image denoising based on noise modeling and sparsity guidance. Experimental results demonstrate that our method can achieve reliable denoising by training on single noisy volume and outperform existing methods.

ULTRAMICROSCOPY (2024)

Article Microscopy

Real-time electron clustering in an event-driven hybrid pixel detector

J. Kuttruff, J. Holder, Y. Meng, P. Baum

Summary: In this study, a robust clustering algorithm is proposed that can find clusters in a continuous stream of raw data in real time. This algorithm converts pixel hits measured by hybrid pixel detectors to real single-electron events. By continuously comparing with previous hits, the algorithm efficiently identifies the merging of new and old events.

ULTRAMICROSCOPY (2024)

Article Microscopy

Atom counting from a combination of two ADF STEM images

D. G. Senturk, C. P. Yu, A. De Backer, S. Van Aert

Summary: This article presents a statistics-based method for accurately counting the number of atoms in nanostructures, especially for images acquired with low electron doses and multiple element structures.

ULTRAMICROSCOPY (2024)

Article Microscopy

Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer

Mauricio J. Prieto, Lucas de Souza Caldas, Liviu C. Tanase, Thomas Schmidt, Oscar Rodriguez de la Fuente

Summary: This study presents a synchrotron-based investigation of the synthesis process of a magnetite/hematite bilayer. Ion bombardment gradually transforms hematite into magnetite, and the growth of magnetite leads to the formation of stable boundaries. These findings are significant for understanding novel oxide heterostructures.

ULTRAMICROSCOPY (2024)

Article Microscopy

Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction

Emre Yoruk, Holger Klein, Stephanie Kodjikian

Summary: Beam sensitive nanomaterials pose challenges for crystallographic structure determination. A dose symmetric electron diffraction tomography (DS-EDT) method is developed to reduce beam damage and obtain complete data sets by merging individual datasets from multiple crystals.

ULTRAMICROSCOPY (2024)

Article Microscopy

Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy

A. Pofelski, Y. Zhu, G. A. Botton

Summary: The precision and sensitivity of the GPA method for strain characterization is a widely discussed topic. This study introduces the concept of phase noise and analyzes the parameter of sampling to improve the precision of GPA. Experimental and theoretical results demonstrate that using a larger pixel spacing in STEM can enhance the precision and sensitivity of the GPA method.

ULTRAMICROSCOPY (2024)

Article Microscopy

Importance of TEM sample thickness for measuring strain fields

Sangjun Kang, Di Wang, Christian Kuebel, Xiaoke Mu

Summary: Transmission electron microscopy is a valuable tool for assessing strain fields within materials. However, using thin specimens in TEM analysis can affect atomic configuration and deformation structure.

ULTRAMICROSCOPY (2024)