4.5 Article

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy

期刊

REVIEW OF SCIENTIFIC INSTRUMENTS
卷 90, 期 8, 页码 -

出版社

AMER INST PHYSICS
DOI: 10.1063/1.5080003

关键词

-

向作者/读者索取更多资源

Microwave cavities oscillating in the TM110 mode can be used as dynamic electron-optical elements inside an electron microscope. By filling the cavity with a dielectric material, it becomes more compact and power efficient, facilitating the implementation in an electron microscope. However, the incorporation of the dielectric material makes the manufacturing process more difficult. Presented here are the steps taken to characterize the dielectric material and to reproducibly fabricate dielectric filled cavities. Also presented are two versions with improved capabilities. The first, called a dual-mode cavity, is designed to support two modes simultaneously. The second has been optimized for low power consumption. With this optimized cavity, a magnetic field strength of 2.84 +/- 0.07 mT was generated at an input power of 14.2 +/- 0.2 W. Due to the low input powers and small dimensions, these dielectric cavities are ideal as electron-optical elements for electron microscopy setups. Published under license by AIP Publishing.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.5
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

Article Chemistry, Physical

Communication: Effects of thermionic-gun parameters on operating modes in ultrafast electron microscopy

Erik Kieft, Karl B. Schliep, Pranav K. Suri, David J. Flannigan

STRUCTURAL DYNAMICS-US (2015)

Article Chemistry, Physical

Time-of-flight electron energy loss spectroscopy using TM110 deflection cavities

W. Verhoeven, J. F. M. van Rens, M. A. W. van Ninhuijs, W. F. Toonen, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

STRUCTURAL DYNAMICS-US (2016)

Article Microscopy

High quality ultrafast transmission electron microscopy using resonant microwave cavities

W. Verhoeven, J. F. M. van Rens, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

ULTRAMICROSCOPY (2018)

Article Microscopy

Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM110 mode for ultrafast electron microscopy

J. F. M. van Rens, W. Verhoeven, J. G. H. Franssen, A. C. Lassise, X. F. D. Stragier, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

ULTRAMICROSCOPY (2018)

Article Physics, Applied

Refinement of Monte Carlo simulations of electron-specimen interaction in low-voltage SEM

Erik Kieft, Eric Bosch

JOURNAL OF PHYSICS D-APPLIED PHYSICS (2008)

Article Physics, Applied

Dual mode microwave deflection cavities for ultrafast electron microscopy

J. F. M. van Rens, W. Verhoeven, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

APPLIED PHYSICS LETTERS (2018)

Article Microscopy

Complementary cathodoluminescence lifetime imaging configurations in a scanning electron microscope

S. Meuret, M. Sola Garcia, T. Coenen, E. Kieft, H. Zeijlemaker, M. Latzel, S. Christiansen, S. Y. Woo, Y. H. Ra, Z. Mi, A. Polman

ULTRAMICROSCOPY (2019)

Article Chemistry, Physical

Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker

I. G. C. Weppelman, R. J. Moerland, L. Zhang, E. Kieft, P. Kruit, J. P. Hoogenboom

STRUCTURAL DYNAMICS-US (2019)

Article Chemistry, Physical

Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities

W. Verhoeven, J. F. M. van Rens, W. F. Toonen, E. R. Kieft, P. H. A. Mutsaers, O. J. Luiten

STRUCTURAL DYNAMICS-US (2018)

Article Engineering, Electrical & Electronic

Optoelectronic properties of expanding thermal plasma deposited textured zinc oxide: Effect of aluminum doping

R Groenen, ER Kieft, JL Linden, MCM Van De Sanden

JOURNAL OF ELECTRONIC MATERIALS (2006)

Article Instruments & Instrumentation

Subnanosecond Thomson scattering setup for space and time resolved measurements with reduced background signal

ER Kieft, CHJM Groothuis, JJAM van der Mullen, V Banine

REVIEW OF SCIENTIFIC INSTRUMENTS (2005)

Article Physics, Applied

Time resolved Thomson scattering measurements on a high pressure mercury lamp

N de Vries, X Zhu, ER Kieft, J van der Mullen

JOURNAL OF PHYSICS D-APPLIED PHYSICS (2005)

Article Physics, Fluids & Plasmas

Comparison of experimental and simulated extreme ultraviolet spectra of xenon and tin discharges

ER Kieft, K Garloff, JJAM van der Mullen, V Banine

PHYSICAL REVIEW E (2005)

Article Physics, Fluids & Plasmas

Characterization of a vacuum-arc discharge in tin vapor using time-resolved plasma imaging and extreme ultraviolet spectrometry

ER Kieft, JJAM van der Mullen, GMW Kroesen, V Banine, KN Koshelev

PHYSICAL REVIEW E (2005)

暂无数据