Calibrated work function mapping by Kelvin probe force microscopy

Effect of argon implantation on solid-state dewetting: control of size and surface density of silicon nanocrystals

(2016) Y Almadori et al.   NANOTECHNOLOGY

Electronic structure investigation of Al0.7Ga0.3As/GaAs nanometric heterostructures by Kelvin force microscopy

(2016) S. Pouch et al.   RSC Advances

Fermi level, work function and vacuum level

(2016) Antoine Kahn   Materials Horizons

Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X-ray Photoelectron Emission Microscopy

(2015) Sylvain Pouch et al.   Journal of Physical Chemistry C

Recommended values of clean metal surface work functions

(2015) Gregory N. Derry et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Accurate Extraction of Electrostatic Force by a Voltage-Pulse Force Spectroscopy

(2015) Eiichi Inami et al.   PHYSICAL REVIEW LETTERS

Kelvin Probe Force Microscopy in Surface Chemistry: Reactivity of Pd Nanoparticles on Highly Oriented Pirolytic Graphite

(2014) Elisa Palacios-Lidón et al.   ACS Catalysis

Manipulation of the graphene surface potential by ion irradiation

(2013) O. Ochedowski et al.   APPLIED PHYSICS LETTERS

Atmospheric contaminants on graphitic surfaces

(2013) David Martinez-Martin et al.   CARBON

Practical aspects of single-pass scan Kelvin probe force microscopy

(2012) Guangyong Li et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Atomic structure of Ag(111) saturated with chlorine: Formation of Ag3Cl7clusters

(2011) B. V. Andryushechkin et al.   PHYSICAL REVIEW B

AFM tip characterization by Kelvin probe force microscopy

(2010) C Barth et al.   NEW JOURNAL OF PHYSICS

Kelvin probe force microscopy and its application

(2010) Wilhelm Melitz et al.   SURFACE SCIENCE REPORTS

Erratum: “A hard x-ray nanoprobe for scanning and projection nanotomography” [Rev. Sci Instrum. 80, 056101 (2009)]

(2009) Pierre Bleuet et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Tip−Sample Interactions in Kelvin Probe Force Microscopy: Quantitative Measurement of the Local Surface Potential

(2008) Andrea Liscio et al.   Journal of Physical Chemistry C

Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

(2008) Th Glatzel et al.   NANOTECHNOLOGY

Effective work functions for ionic and electronic emissions from mono- and polycrystalline surfaces

(2008) Hiroyuki Kawano   PROGRESS IN SURFACE SCIENCE