Effect of solder resist dissolution on the joint reliability of ENIG surface and Sn–Ag–Cu solder

标题
Effect of solder resist dissolution on the joint reliability of ENIG surface and Sn–Ag–Cu solder
作者
关键词
-
出版物
MICROELECTRONICS RELIABILITY
Volume 87, Issue -, Pages 75-80
出版商
Elsevier BV
发表日期
2018-06-12
DOI
10.1016/j.microrel.2018.05.017

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