Nondestructive imaging of atomically thin nanostructures buried in silicon

Uncovering edge states and electrical inhomogeneity in MoS2field-effect transistors

(2016) Di Wu et al.   PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

Noninvasive, near-field terahertz imaging of hidden objects using a single-pixel detector

(2016) R. I. Stantchev et al.   Science Advances

The Impact of Dopant Segregation on the Maximum Carrier Density in Si:P Multilayers

(2015) Joris G. Keizer et al.   ACS Nano

Depth-Sensitive Subsurface Imaging of Polymer Nanocomposites Using Second Harmonic Kelvin Probe Force Microscopy

(2015) Octavio Alejandro Castañeda-Uribe et al.   ACS Nano

Suppressing Segregation in Highly Phosphorus Doped Silicon Monolayers

(2015) Joris G. Keizer et al.   ACS Nano

Microwave Near-Field Imaging of Two-Dimensional Semiconductors

(2015) Samuel Berweger et al.   NANO LETTERS

Direct Imaging of Nanoscale Conductance Evolution in Ion-Gel-Gated Oxide Transistors

(2015) Yuan Ren et al.   NANO LETTERS

Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy

(2015) Enrico Brinciotti et al.   Nanoscale

Scanning capacitance microscopy registration of buried atomic-precision donor devices

(2015) E Bussmann et al.   NANOTECHNOLOGY

Quantitative sub-surface and non-contact imaging using scanning microwave microscopy

(2015) Georg Gramse et al.   NANOTECHNOLOGY

Quantum dot spectroscopy using a single phosphorus donor

(2015) Holger Büch et al.   PHYSICAL REVIEW B

A surface code quantum computer in silicon

(2015) C. D. Hill et al.   Science Advances

Measuring low loss dielectric substrates with scanning probe microscopes

(2014) Johannes Hoffmann et al.   APPLIED PHYSICS LETTERS

Imaging of buried phosphorus nanostructures in silicon using scanning tunneling microscopy

(2014) Lars Oberbeck et al.   APPLIED PHYSICS LETTERS

Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology

(2014) Atif Imtiaz et al.   IEEE MICROWAVE MAGAZINE

Calibrated complex impedance and permittivity measurements with scanning microwave microscopy

(2014) G Gramse et al.   NANOTECHNOLOGY

Imaging Impurities in Semiconductor Nanostructures

(2013) Vincent C. Holmberg et al.   CHEMISTRY OF MATERIALS

Sub-surface imaging of carbon nanotube–polymer composites using dynamic AFM methods

(2013) Maria J Cadena et al.   NANOTECHNOLOGY

Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope

(2012) A. Imtiaz et al.   JOURNAL OF APPLIED PHYSICS

Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe

(2012) G Gramse et al.   NANOTECHNOLOGY

Ohm's Law Survives to the Atomic Scale

(2012) B. Weber et al.   SCIENCE

Disentangling time in a near-field approach to scanning probe microscopy

(2011) Marco Farina et al.   Nanoscale

Quantifying the dielectric constant of thick insulators using electrostatic force microscopy

(2010) L. Fumagalli et al.   APPLIED PHYSICS LETTERS

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

(2010) H. P. Huber et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Investigating the regrowth surface of Si:P δ-layers toward vertically stacked three dimensional devices

(2009) S. R. McKibbin et al.   APPLIED PHYSICS LETTERS

Hierarchy of Electronic Properties of Chemically Derived and Pristine Graphene Probed by Microwave Imaging

(2009) Worasom Kundhikanjana et al.   NANO LETTERS

Investigating the surface quality and confinement of Si:P at different growth temperatures

(2009) Sarah R. McKibbin et al.   PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES

Calibration of shielded microwave probes using bulk dielectrics

(2008) K. Lai et al.   APPLIED PHYSICS LETTERS

Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope

(2008) K. Lai et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

The effect of surface proximity on electron transport through ultra-shallow -doped layers in silicon

(2007) W.R. Clarke et al.   PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES