标题
Ultrafast RESET Analysis of HfO
x
-Based RRAM by Sub-Nanosecond Pulses
作者
关键词
-
出版物
Advanced Electronic Materials
Volume 3, Issue 12, Pages 1700263
出版商
Wiley
发表日期
2017-10-05
DOI
10.1002/aelm.201700263
参考文献
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