An efficient similarity measure approach for PCB surface defect detection

Dimensionality Reduction and Classification of Hyperspectral Images Using Ensemble Discriminative Local Metric Learning

(2017) Yanni Dong et al.   IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING

Energy-efficient adaptive optical character recognition for wearable devices

(2016) Seungjoo Son et al.   ELECTRONICS LETTERS

Sparsity-Induced Similarity Measure and Its Applications

(2016) Hong Cheng et al.   IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY

A novel method for surface defect inspection of optic cable with short-wave infrared illuminance

(2016) Xiaohong Chen et al.   INFRARED PHYSICS & TECHNOLOGY

Image focus measure based on polynomial coefficients and spectral radius

(2015) Vilas H. Gaidhane et al.   Signal Image and Video Processing

Saliency-Based Defect Detection in Industrial Images by Using Phase Spectrum

(2014) Xiaolong Bai et al.   IEEE Transactions on Industrial Informatics

An efficient approach for face recognition based on common eigenvalues

(2013) Vilas H. Gaidhane et al.   PATTERN RECOGNITION

A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection

(2011) Du-Ming Tsai et al.   IEEE Transactions on Industrial Informatics

Sub-pixel precision image matching for measuring surface displacements on mass movements using normalized cross-correlation

(2010) Misganu Debella-Gilo et al.   REMOTE SENSING OF ENVIRONMENT

Fast Template Matching Based on Normalized Cross Correlation With Adaptive Multilevel Winner Update

(2008) Shou-Der Wei et al.   IEEE TRANSACTIONS ON IMAGE PROCESSING

Computer-Vision-Based Fabric Defect Detection: A Survey

(2008) A. Kumar   IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

Invariant 2D object recognition using eigenvalues of covariance matrices, re-sampling and autocorrelation

(2007) Te-Hsiu Sun et al.   EXPERT SYSTEMS WITH APPLICATIONS

Multimodality image registration by maximization of quantitative–qualitative measure of mutual information

(2007) Hongxia Luan et al.   PATTERN RECOGNITION