标题
Saliency-Based Defect Detection in Industrial Images by Using Phase Spectrum
作者
关键词
-
出版物
IEEE Transactions on Industrial Informatics
Volume 10, Issue 4, Pages 2135-2145
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2014-09-23
DOI
10.1109/tii.2014.2359416
参考文献
相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。- Asymmetric Correlation: A Noise Robust Similarity Measure for Template Matching
- (2013) E. Elboher et al. IEEE TRANSACTIONS ON IMAGE PROCESSING
- Automated Inspection of E-Shaped Magnetic Core Elements Using K-tSL-Center Clustering and Active Shape Models
- (2013) Huijun Gao et al. IEEE Transactions on Industrial Informatics
- Machine Vision-Based Defect Detection in IC Images Using the Partial Information Correlation Coefficient
- (2013) Chien-Chih Wang et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Template-based defect detection of a brazed heat exchanger using an x-ray image
- (2013) Jinyoung Kim OPTICAL ENGINEERING
- Defect Inspection of Flip Chip Solder Bumps Using an Ultrasonic Transducer
- (2013) Lei Su et al. SENSORS
- Defect Detection in Solar Modules Using ICA Basis Images
- (2012) Du-Ming Tsai et al. IEEE Transactions on Industrial Informatics
- A hybrid defect detection for in-tray semiconductor chip
- (2012) Chin-Sheng Chen et al. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- A computational model of vision attention for inspection of surface quality in production line
- (2012) Guohui Li et al. MACHINE VISION AND APPLICATIONS
- Defect detection using feature point matching for non-repetitive patterned images
- (2012) Hye Won Kim et al. PATTERN ANALYSIS AND APPLICATIONS
- A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection
- (2011) Du-Ming Tsai et al. IEEE Transactions on Industrial Informatics
- Bottom-Up Saliency Detection Model Based on Human Visual Sensitivity and Amplitude Spectrum
- (2011) Yuming Fang et al. IEEE TRANSACTIONS ON MULTIMEDIA
- Image Signature: Highlighting Sparse Salient Regions
- (2011) Xiaodi Hou et al. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE
- A Wavelet-Based Approach in Detecting Visual Defects on Semiconductor Wafer Dies
- (2010) Chi-Hao Yeh et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection
- (2010) Chun-Hsi Li et al. IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND RE
- Efficient template matching for multi-channel images
- (2010) Stefano Mattoccia et al. PATTERN RECOGNITION LETTERS
- Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection
- (2009) Wei-Chen Li et al. IEEE Transactions on Industrial Informatics
- Automatic recognition of defect areas on a semiconductor wafer using multiple scanning electron microscope images
- (2009) Ryo Nakagaki et al. MEASUREMENT SCIENCE and TECHNOLOGY
Create your own webinar
Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.
Create NowBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started