Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation

标题
Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Ion Beam (FIB) Preparation
作者
关键词
-
出版物
MICROSCOPY AND MICROANALYSIS
Volume 23, Issue S1, Pages 300-301
出版商
Cambridge University Press (CUP)
发表日期
2017-08-09
DOI
10.1017/s1431927617002185

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