Effect of the film thickness on the crystal structure and ferroelectric properties of (Hf 0.5 Zr 0.5 )O 2 thin films deposited on various substrates

标题
Effect of the film thickness on the crystal structure and ferroelectric properties of (Hf 0.5 Zr 0.5 )O 2 thin films deposited on various substrates
作者
关键词
(Hf, 0.5, Zr, 0.5, )O, 2, thin films, Ferroelectric property, Film thickness dependence
出版物
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 70, Issue -, Pages 239-245
出版商
Elsevier BV
发表日期
2016-12-24
DOI
10.1016/j.mssp.2016.12.008

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