Near-Field Integration of a SiN Nanobeam and aSiO2Microcavity for Heisenberg-Limited Displacement Sensing
出版年份 2016 全文链接
标题
Near-Field Integration of a SiN Nanobeam and aSiO2Microcavity for Heisenberg-Limited Displacement Sensing
作者
关键词
-
出版物
Physical Review Applied
Volume 5, Issue 5, Pages -
出版商
American Physical Society (APS)
发表日期
2016-05-27
DOI
10.1103/physrevapplied.5.054019
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