Analysis of Current-Voltage-Temperature and Capacitance-Voltage-Temperature Characteristics of Re/n-Si Schottky Contacts
出版年份 2016 全文链接
标题
Analysis of Current-Voltage-Temperature and Capacitance-Voltage-Temperature Characteristics of Re/n-Si Schottky Contacts
作者
关键词
MS device, I-V-T and C-V-T characteristics, Electrical properties, Gaussian distribution
出版物
Silicon
Volume 10, Issue 2, Pages 361-369
出版商
Springer Nature
发表日期
2016-11-02
DOI
10.1007/s12633-016-9456-2
参考文献
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