Effects of low-temperature annealing on electrical properties of Thin-film Transistors based on Zinc Oxide films deposited by ultrasonic spray pyrolysis: Impact of annealing time

标题
Effects of low-temperature annealing on electrical properties of Thin-film Transistors based on Zinc Oxide films deposited by ultrasonic spray pyrolysis: Impact of annealing time
作者
关键词
ZnO, Thin-film transistors, X-ray diffraction, Electrical properties
出版物
THIN SOLID FILMS
Volume 615, Issue -, Pages 243-246
出版商
Elsevier BV
发表日期
2016-07-18
DOI
10.1016/j.tsf.2016.07.036

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