Energy band diagram of metal/Tm 2 O 3 /Si stack structure acquired from the study of leakage current mechanisms

标题
Energy band diagram of metal/Tm 2 O 3 /Si stack structure acquired from the study of leakage current mechanisms
作者
关键词
Leakage current mechanisms, Fowler-Nordheim tunneling, Schottky emission, Tm, 2, O, 3
出版物
THIN SOLID FILMS
Volume 611, Issue -, Pages 52-55
出版商
Elsevier BV
发表日期
2016-05-13
DOI
10.1016/j.tsf.2016.05.015

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