Genome-wide association mapping for seedling and field resistance to Puccinia striiformis f. sp. tritici in elite durum wheat

标题
Genome-wide association mapping for seedling and field resistance to Puccinia striiformis f. sp. tritici in elite durum wheat
作者
关键词
Quantitative Trait Locus, Durum Wheat, Stripe Rust, Single Nucleotide Polymorphism Marker, Infection Type
出版物
THEORETICAL AND APPLIED GENETICS
Volume 130, Issue 4, Pages 649-667
出版商
Springer Nature
发表日期
2016-12-30
DOI
10.1007/s00122-016-2841-9

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