A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures
出版年份 2016 全文链接
标题
A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures
作者
关键词
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出版物
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
Volume 18, Issue 32, Pages 22160-22167
出版商
Royal Society of Chemistry (RSC)
发表日期
2016-07-15
DOI
10.1039/c6cp02033j
参考文献
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