4.8 Article

Porous Silicon Gradient Refractive Index Micro-Optics

期刊

NANO LETTERS
卷 16, 期 12, 页码 7402-7407

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.6b02939

关键词

Microlenses; transformation optics; silicon photonics; birefringence

资金

  1. Dow Chemical Company
  2. U.S. Department of Energy Light-Material Interactions in Energy Conversion Energy Frontier Research Center [DE-SC0001293]
  3. DoD, Air Force Office of Scientific Research [32 CFR 168a]
  4. Division Of Materials Research
  5. Direct For Mathematical & Physical Scien [1608927] Funding Source: National Science Foundation

向作者/读者索取更多资源

The emergence and growth of transformation optics over the past decade has revitalized interest in how a gradient refractive index (GRIN) can be used to control light propagation. Two-dimensional demonstrations with lithographically defined silicon (Si) have displayed the power of GRIN optics and also represent a promising opportunity for integrating compact optical elements within Si photonic integrated circuits. Here, we demonstrate the fabrication of three-dimensional Si-based GRIN micro-optics through the shape-defined formation of porous Si (PSi). Conventional microfabrication creates Si square microcolumns (SMCs) that can be electrochemically etched into PSi elements with nanoscale porosity along the shape-defined etching pathway, which imparts the geometry with structural birefringence. Free-space characterization of the transmitted intensity distribution through a homogeneously etched PSi SMC exhibits polarization splitting behavior resembling that of dielectric metasurfaces that require considerably more laborious fabrication. Coupled birefringence/GRIN effects are studied by way of PSi SMCs etched with a linear (increasing from edge to center) GRIN profile. The transmitted intensity distribution shows polarization-selective focusing behavior with one polarization focused to a diffraction-limited spot and the orthogonal polarization focused into two laterally displaced foci. Optical thickness-based analysis readily predicts the experimentally observed phenomena, which strongly match finite-element electromagnetic simulations.

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