标题
Acceleration invariance principle for Hougaard processes in degradation analysis
作者
关键词
-
出版物
NAVAL RESEARCH LOGISTICS
Volume -, Issue -, Pages -
出版商
Wiley
发表日期
2023-09-28
DOI
10.1002/nav.22153
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes
- (2021) Zhen Chen et al. IEEE TRANSACTIONS ON RELIABILITY
- Exponential Dispersion Process for Degradation Analysis
- (2019) Shirong Zhou et al. IEEE TRANSACTIONS ON RELIABILITY
- Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning
- (2019) Zhen Chen et al. IEEE TRANSACTIONS ON RELIABILITY
- Hougaard process stochastic model to predict wall thickness in Flow Accelerated Corrosion
- (2018) Mahendra Prasad et al. ANNALS OF NUCLEAR ENERGY
- Design an Optimal Accelerated-Stress Reliability Acceptance Test Plan Based on Acceleration Factor
- (2018) Hao-Wei Wang et al. IEEE TRANSACTIONS ON RELIABILITY
- Inference for constant-stress accelerated degradation test based on Gamma process
- (2018) Pei Hua Jiang et al. APPLIED MATHEMATICAL MODELLING
- Optimal design of constant-stress accelerated degradation tests using the M -optimality criterion
- (2017) Han Wang et al. RELIABILITY ENGINEERING & SYSTEM SAFETY
- Acceleration Factor Constant Principle and the Application under ADT
- (2016) Hao-Wei Wang et al. QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
- Planning of step-stress accelerated degradation test based on the inverse Gaussian process
- (2016) Huan Wang et al. RELIABILITY ENGINEERING & SYSTEM SAFETY
- Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models
- (2016) Sheng-Tsaing Tseng et al. TECHNOMETRICS
- Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process
- (2015) Man Ho Ling et al. IEEE TRANSACTIONS ON RELIABILITY
- Accelerated Degradation Test Planning Using the Inverse Gaussian Process
- (2014) Zhi-Sheng Ye et al. IEEE TRANSACTIONS ON RELIABILITY
- Inverse Gaussian Processes With Random Effects and Explanatory Variables for Degradation Data
- (2014) Chien-Yu Peng TECHNOMETRICS
- Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes
- (2010) Zhengqiang Pan et al. COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION
- Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes
- (2009) Sheng-Tsaing Tseng et al. IEEE TRANSACTIONS ON RELIABILITY
Discover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversationPublish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn More