Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning

标题
Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning
作者
关键词
-
出版物
IEEE TRANSACTIONS ON RELIABILITY
Volume 69, Issue 3, Pages 887-902
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2019-12-14
DOI
10.1109/tr.2019.2955596

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now