Multi-layer parallel transformer model for detecting product quality issues and locating anomalies based on multiple time‑series process data in Industry 4.0
出版年份 2023 全文链接
标题
Multi-layer parallel transformer model for detecting product quality issues and locating anomalies based on multiple time‑series process data in Industry 4.0
作者
关键词
-
出版物
JOURNAL OF MANUFACTURING SYSTEMS
Volume 70, Issue -, Pages 501-513
出版商
Elsevier BV
发表日期
2023-08-31
DOI
10.1016/j.jmsy.2023.08.013
参考文献
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注意：仅列出部分参考文献，下载原文获取全部文献信息。- Fault Diagnosis Method for MMC-HVDC Based on Bi-GRU Neural Network
- (2022) Yanting Wang et al. Energies
- Attention Mechanism-Based Root Cause Analysis for Semiconductor Yield Enhancement Considering the Order of Manufacturing Processes
- (2022) Min Yong Lee et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Cloud-edge orchestration-based bi-level autonomous process control for mass individualization of rapid printed circuit boards prototyping services
- (2022) Jiewu Leng et al. JOURNAL OF MANUFACTURING SYSTEMS
- Industry 5.0 and Society 5.0—Comparison, complementation and co-evolution
- (2022) Sihan Huang et al. JOURNAL OF MANUFACTURING SYSTEMS
- A Literature Review of the Challenges and Opportunities of the Transition from Industry 4.0 to Society 5.0
- (2022) Dimitris Mourtzis et al. Energies
- Industry 5.0: Prospect and retrospect
- (2022) Jiewu Leng et al. JOURNAL OF MANUFACTURING SYSTEMS
- Digital twins-based remote semi-physical commissioning of flow-type smart manufacturing systems
- (2021) Jiewu Leng et al. Journal of Cleaner Production
- A fault diagnosis method based on attention mechanism with application in Qianlong-2 autonomous underwater vehicle
- (2021) Shaoxuan Xia et al. OCEAN ENGINEERING
- Bearing Fault Diagnosis Method Based on EEMD and LSTM
- (2020) Ping Zou et al. International Journal of Computers Communications & Control
- Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing
- (2020) Chia-Yu Hsu et al. JOURNAL OF INTELLIGENT MANUFACTURING
- Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing
- (2020) Shu-Kai S. Fan et al. IEEE Transactions on Automation Science and Engineering
- A loosely-coupled deep reinforcement learning approach for order acceptance decision of mass-individualized printed circuit board manufacturing in industry 4.0
- (2020) Jiewu Leng et al. JOURNAL OF CLEANER PRODUCTION
- Continual lifelong learning with neural networks: A review
- (2019) German I. Parisi et al. NEURAL NETWORKS
- Simulation in the design and operation of manufacturing systems: state of the art and new trends
- (2019) Dimitris Mourtzis INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- A data-driven approach to selection of critical process steps in the semiconductor manufacturing process considering missing and imbalanced data
- (2019) Dong-Hee Lee et al. JOURNAL OF MANUFACTURING SYSTEMS
- Fault Detection and Diagnosis Using Self-Attentive Convolutional Neural Networks for Variable-Length Sensor Data in Semiconductor Manufacturing
- (2019) Eunji Kim et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Makerchain: A blockchain with chemical signature for self-organizing process in social manufacturing
- (2019) Jiewu Leng et al. JOURNAL OF CLEANER PRODUCTION
- Bidirectional Recurrent Neural Network-Based Chemical Process Fault Diagnosis
- (2019) Shuyuan Zhang et al. INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH
- Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data
- (2018) Hamideh Rostami et al. APPLIED SOFT COMPUTING
- A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes
- (2017) Ki Bum Lee et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- A graph-based semi-supervised k nearest-neighbor method for nonlinear manifold distributed data classification
- (2016) Enmei Tu et al. INFORMATION SCIENCES
- Least-Squares Fault Detection and Diagnosis for Networked Sensing Systems Using A Direct State Estimation Approach
- (2013) Xiao He et al. IEEE Transactions on Industrial Informatics
- Diagnosis of Three-Phase Electrical Machines Using Multidimensional Demodulation Techniques
- (2011) V. Choqueuse et al. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
- A PLS-Based Statistical Approach for Fault Detection and Isolation of Robotic Manipulators
- (2011) Riccardo Muradore et al. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
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