Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart–Thornley Detector Systems

Structural changes during the reaction of Ni thin films with (100) silicon substrates

(2012) Andrew M. Thron et al.   ACTA MATERIALIA

Ni–Au bi-metallic nanoparticles formed via dewetting

(2011) Dong Wang et al.   MATERIALS LETTERS

A comparison of conventional Everhart-Thornley style and in-lens secondary electron detectors-a further variable in scanning electron microscopy

(2011) Brendan J. Griffin   SCANNING

The Introduction and Application of a Selective Directional Capability of the Image Contrast Transfer Function in the ImageJ “SMARTeR” Package

(2010) BJ Griffin et al.   MICROSCOPY AND MICROANALYSIS

Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping

(2010) C. Rodenburg et al.   ULTRAMICROSCOPY

Sharing of secondary electrons by in-lens and out-lens detector in low-voltage scanning electron microscope equipped with immersion lens

(2009) Kazuhiro Kumagai et al.   ULTRAMICROSCOPY