Molecular dynamics study on the thickness of damage layer in multiple grinding of monocrystalline silicon

标题
Molecular dynamics study on the thickness of damage layer in multiple grinding of monocrystalline silicon
作者
关键词
Molecular dynamics, Monocrystalline silicon, Thickness, Damage layer, Multiple grinding
出版物
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 51, Issue -, Pages 15-19
出版商
Elsevier BV
发表日期
2016-05-07
DOI
10.1016/j.mssp.2016.04.013

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