A novel approach to the characterization of thin oxide layers

标题

作者

关键词

Microstructure, TEM, ASTAR, Oxide layer, Oxidation, Sanicro 25, Cr, 2, O, 3, scale

出版物

Volume 173, Issue -, Pages 235-238

出版商

Elsevier BV

发表日期

2016-03-03

DOI

10.1016/j.matlet.2016.02.104

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