标题
Cryo-FIB for TEM investigation of soft matter and beam sensitive energy materials
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 33, Issue 50, Pages 503001
出版商
IOP Publishing
发表日期
2022-09-20
DOI
10.1088/1361-6528/ac92eb
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Fabrication of a Microcavity Prepared by Remote Epitaxy over Monolayer Molybdenum Disulfide
- (2022) Yeonhoo Kim et al. ACS Nano
- Molecular Dynamics Simulation and Cryo-Electron Microscopy Investigation of AOT Surfactant Structure at the Hydrated Mica Surface
- (2022) Daniel M. Long et al. Minerals
- A Heterogeneous Oxide Enables Reversible Calcium Electrodeposition for a Calcium Battery
- (2022) Scott A. McClary et al. ACS Energy Letters
- Cryogenic Laser Ablation Reveals Short-Circuit Mechanism in Lithium Metal Batteries
- (2021) Katherine L. Jungjohann et al. ACS Energy Letters
- Wafer-scale quasi-layered tungstate-doped polypyrrole film with high volumetric capacitance
- (2021) Huabo Liu et al. Nano Research
- Cryogenic electron microscopy reveals that applied pressure promotes short circuits in Li batteries
- (2021) Katharine L. Harrison et al. iScience
- Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography
- (2020) Felix R. Wagner et al. Nature Protocols
- Cryo‐FIB‐lift‐out: practically impossible to practical reality
- (2020) CHRISTOPHER DAVID PARMENTER et al. JOURNAL OF MICROSCOPY
- An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB
- (2020) Xiang Li Zhong et al. ULTRAMICROSCOPY
- Optimization of Pt-C Deposits by Cryo-FIBID: Substantial Growth Rate Increase and Quasi-Metallic Behaviour
- (2020) Alba Salvador-Porroche et al. Nanomaterials
- Radiation damage to organic and inorganic specimens in the TEM
- (2019) R.F. Egerton MICRON
- Ti and its alloys as examples of cryogenic focused ion beam milling of environmentally-sensitive materials
- (2019) Yanhong Chang et al. Nature Communications
- Size and shape of Nafion particles in water after high‐temperature treatment
- (2019) Makoto Yamaguchi et al. JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
- Effect of molecular weight on vitrification kinetics and molecular mobility of a polymer glass confined at the microscale
- (2019) Xavier Monnier et al. THERMOCHIMICA ACTA
- Soft matter and nanomaterials characterization by cryogenic transmission electron microscopy
- (2019) John Watt et al. MRS BULLETIN
- Cryo-STEM mapping of solid–liquid interfaces and dendrites in lithium-metal batteries
- (2018) Michael J. Zachman et al. NATURE
- A method for site-specific and cryogenic specimen fabrication of liquid/solid interfaces for atom probe tomography
- (2018) D.K. Schreiber et al. ULTRAMICROSCOPY
- Cryo-FIB specimen preparation for use in a cartridge-type cryo-TEM
- (2017) Jie He et al. JOURNAL OF STRUCTURAL BIOLOGY
- Atomic structure of sensitive battery materials and interfaces revealed by cryo–electron microscopy
- (2017) Yuzhang Li et al. SCIENCE
- Site-Specific Preparation of Intact Solid–Liquid Interfaces by Label-Free In Situ Localization and Cryo-Focused Ion Beam Lift-Out
- (2016) Michael J. Zachman et al. MICROSCOPY AND MICROANALYSIS
- Making the practically impossible “Merely difficult”-Cryogenic FIB lift-out for “Damage free” soft matter imaging
- (2016) Christopher D.J. Parmenter et al. MICROSCOPY RESEARCH AND TECHNIQUE
- A focused ion beam milling and lift-out approach for site-specific preparation of frozen-hydrated lamellas from multicellular organisms
- (2015) Julia Mahamid et al. JOURNAL OF STRUCTURAL BIOLOGY
- Morphology of Hydrated As-Cast Nafion Revealed through Cryo Electron Tomography
- (2014) Frances I. Allen et al. ACS Macro Letters
- Thinning of large mammalian cells for cryo-TEM characterization by cryo-FIB milling
- (2012) K.M. STRUNK et al. JOURNAL OF MICROSCOPY
- A site-specific focused-ion-beam lift-out method for cryo Transmission Electron Microscopy
- (2012) Stefano Rubino et al. JOURNAL OF STRUCTURAL BIOLOGY
- Mechanisms of radiation damage in beam-sensitive specimens, for TEM accelerating voltages between 10 and 300 kV
- (2012) R.F. Egerton MICROSCOPY RESEARCH AND TECHNIQUE
- Minimizing damage during FIB sample preparation of soft materials
- (2011) N.D. BASSIM et al. JOURNAL OF MICROSCOPY
- NanoSIMS imaging of Bacillus spores sectioned by focused ion beam
- (2009) P.K. WEBER et al. JOURNAL OF MICROSCOPY
- Improving the technique of vitreous cryo-sectioning for cryo-electron tomography: Electrostatic charging for section attachment and implementation of an anti-contamination glove box
- (2009) Jason Pierson et al. JOURNAL OF STRUCTURAL BIOLOGY
Discover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversationBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started