Measuring and Then Eliminating Twin Domains in SnSe Thin Films Using Fast Optical Metrology and Molecular Beam Epitaxy
出版年份 2022 全文链接
标题
Measuring and Then Eliminating Twin Domains in SnSe Thin Films Using Fast Optical Metrology and Molecular Beam Epitaxy
作者
关键词
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出版物
ACS Nano
Volume 16, Issue 6, Pages 9472-9478
出版商
American Chemical Society (ACS)
发表日期
2022-06-17
DOI
10.1021/acsnano.2c02459
参考文献
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