Low-leakage sub-threshold 9 T-SRAM cell in 14-nm FinFET technology

标题
Low-leakage sub-threshold 9 T-SRAM cell in 14-nm FinFET technology
作者
关键词
-
出版物
出版商
Wiley
发表日期
2016-11-07
DOI
10.1002/cta.2280

向作者/读者发起求助以获取更多资源

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started