On the possibility of indirect measurement of the thin carbon films thickness using energy-dispersive analysis

Coating Thickness Determination Using X-ray Fluorescence Spectroscopy: Monte Carlo Simulations as an Alternative to the Use of Standards

(2019) Walter Giurlani et al.   Coatings

Reference-free evaluation of thin films mass thickness and composition through energy dispersive X-ray spectroscopy

(2019) Andrea Pazzaglia et al.   MATERIALS CHARACTERIZATION

X-ray Microanalysis of Precious Metal Thin Films: Thickness and Composition Determination

(2018) Walter Giurlani et al.   Coatings

Optical constants and structural properties of thin gold films

(2017) Dmitry I. Yakubovsky et al.   OPTICS EXPRESS

Energy dispersive x-ray spectroscopy for nanostructured thin film density evaluation

(2015) Irene Prencipe et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

Ultra-thin films for plasmonics: a technology overview

(2015) Radu Malureanu et al.   Nanotechnology Reviews

Compact chromium oxide thin film resistors for use in nanoscale quantum circuits

(2014) C. R. Nash et al.   JOURNAL OF APPLIED PHYSICS

Monte Carlo simulation of X-ray imaging and spectroscopy experiments using quadric geometry and variance reduction techniques

(2013) Bruno Golosio et al.   COMPUTER PHYSICS COMMUNICATIONS

A general Monte Carlo simulation of energy-dispersive X-ray fluorescence spectrometers — Part 6. Quantification through iterative simulations

(2013) Tom Schoonjans et al.   SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

A general Monte Carlo simulation of energy dispersive X-ray fluorescence spectrometers — Part 5

(2012) Tom Schoonjans et al.   SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

Three-dimensional electron microscopy simulation with the CASINO Monte Carlo software

(2011) Hendrix Demers et al.   SCANNING