Precise localization of contaminants in graphene with secondary ion mass spectrometry

标题
Precise localization of contaminants in graphene with secondary ion mass spectrometry
作者
关键词
Secondary ion mass spectrometry, Graphene, Contaminations, Graphene–copper composite, 2D materials
出版物
MEASUREMENT
Volume 187, Issue -, Pages 110308
出版商
Elsevier BV
发表日期
2021-10-19
DOI
10.1016/j.measurement.2021.110308

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