Gate energy efficiency and negative capacitance in ferroelectric 2D/2D TFET from cryogenic to high temperatures
出版年份 2021 全文链接
标题
Gate energy efficiency and negative capacitance in ferroelectric 2D/2D TFET from cryogenic to high temperatures
作者
关键词
-
出版物
npj 2D Materials and Applications
Volume 5, Issue 1, Pages -
出版商
Springer Science and Business Media LLC
发表日期
2021-09-07
DOI
10.1038/s41699-021-00257-6
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