Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy
出版年份 2021 全文链接
标题
Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy
作者
关键词
-
出版物
Light-Science & Applications
Volume 10, Issue 1, Pages -
出版商
Springer Science and Business Media LLC
发表日期
2021-04-15
DOI
10.1038/s41377-021-00524-7
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