Going submicron in the precise analysis of soil structure: A FIB-SEM imaging study at nanoscale

标题
Going submicron in the precise analysis of soil structure: A FIB-SEM imaging study at nanoscale
作者
关键词
Soil structure at the nano-scale, X-ray micro-tomography, Nanopores, Pore-size distribution, SEM imaging, FIB milling
出版物
GEODERMA
Volume 383, Issue -, Pages 114739
出版商
Elsevier BV
发表日期
2020-09-25
DOI
10.1016/j.geoderma.2020.114739

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